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Dynamic Image Analysis Beats Laser Diffraction in a Micron to Millimeter Range

Jan. 03, 2011
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Laser diffraction is the most frequently used measurement technique for the analysis of particle size distributions in the range 1 micron to 1 mm in the context of quality control. Modern laser diffraction systems offer some convincing advantages such as short measurement times, easy operation and reproducible analysis results. However, they also have various disadvantages: Even if the instruments have been calibrated and validated, an absolute particle size measurement is not possible. Various round robin tests have shown that the analysis results depend strongly on the type of instrument and even on the particular model and software version.

Authors:
Jörg Westermann, Retsch Technology GmbH

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Keywords : Dynamic Image Processing Jörg Westermann Laser Diffraction laser light scattering Particle Particle Measurement Retsch Retsch Technology

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