Auriga Laser: Combination of FIB/SEM Technology with Laser Ablation for Fast Sample Preparation
G.I.T. InnovationsAward 2012: 1st Place in Category C "Laboratory Equipment and Technology"
The Auriga Laser got nominated in the category B of the G.I.T. InnovationsAward 2012. This laser combines the advantages of the CrossBeam (FIB-SEM) workstation with the capabilities of a pulsed micro-focus laser for fast ablation of material. The system is suited for the microscopic examination of samples where the target structure is buried under material layers. To gain access to the target structure this material needs to be removed. Mechanical ablation and cross-sectioning of large material volumes often causes deformations, making the sample unsuitable for further examination. In contrast, applying a focused ion beam is inefficient, because the process is much too slow. Ablation with a pulsed micro-focus laser beam does not damage the sample, and it enables ablation rates comparable to mechanical removal.
Category C: Laboratory Equipment & Technology
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ACHEMA 2012 GUIDE
--> Carl Zeiss MicroImaging, hall 4.2, booth G66
--> GIT VERLAG, at the passage from hall 5 to hall 6, booth B2/B6